Cost Effective Test Methodology Using Pmu for Automated Test Equipment Systems

In this paper, test methodology using parametric measurement unit is proposed for Automated Test Equipment (ATE) systems using 600MHz Driver, Comparator, and Active load (DCL). ATE systems is a very important means to reduce the device test cost, and the systems should be able to test several modes to check the performance characteristics of the device. The proposed methodology provides four different types of test operation for DC and AC analysis of the Device-Under-Test(DUT). Along with the proposed methodology, the paper proposes ATE system integration methodology for cost effective ATE integration for high speed test. The measured test results using the proposed method and system turned out to be well within the target specifications with high accuracies.